In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
We present an efficient optimization scheme for gate sizing in the presence of process variations. Our method is a worst-case design scheme, but it reduces the pessimism involved i...
Jaskirat Singh, Zhi-Quan Luo, Sachin S. Sapatnekar
Adaptive Body Biasing (ABB) is a popularly used technique to mitigate the increasing impact of manufacturing process variations on leakage power dissipation. The efficacy of the ...
This paper investigates a Bayesian model and a Markov chain Monte Carlo (MCMC) algorithm for gene factor analysis. Each sample in the dataset is decomposed as a linear combination...
Cecile Bazot, Nicolas Dobigeon, Jean-Yves Tournere...
In applications like location-based services, sensor monitoring and biological databases, the values of the database items are inherently uncertain in nature. An important query fo...
Reynold Cheng, Jinchuan Chen, Mohamed F. Mokbel, C...