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KBSE
2005
IEEE
14 years 3 months ago
Automated test generation for engineering applications
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
Songtao Xia, Ben Di Vito, César Muño...
LCTRTS
2004
Springer
14 years 3 months ago
A trace-based binary compilation framework for energy-aware computing
Energy-aware compilers are becoming increasingly important for embedded systems due to the need to meet conflicting constraints on time, code size and power consumption. We intro...
Lian Li 0002, Jingling Xue
ISCA
2010
IEEE
219views Hardware» more  ISCA 2010»
14 years 3 months ago
Using hardware vulnerability factors to enhance AVF analysis
Fault tolerance is now a primary design constraint for all major microprocessors. One step in determining a processor’s compliance to its failure rate target is measuring the Ar...
Vilas Sridharan, David R. Kaeli
PLDI
2010
ACM
14 years 3 months ago
Z-rays: divide arrays and conquer speed and flexibility
Arrays are the ubiquitous organization for indexed data. Throughout programming language evolution, implementations have laid out arrays contiguously in memory. This layout is pro...
Jennifer B. Sartor, Stephen M. Blackburn, Daniel F...
GPCE
2009
Springer
14 years 2 months ago
Classifying Java class transformations for pervasive virtualized access
The indirection of object accesses is a common theme for target domains as diverse as transparent distribution, persistence, and program instrumentation. Virtualizing accesses to ...
Phil McGachey, Antony L. Hosking, J. Eliot B. Moss