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DFT
2006
IEEE
105views VLSI» more  DFT 2006»
14 years 3 months ago
Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
Zhiyuan He, Zebo Peng, Petru Eles, Paul M. Rosinge...
GLOBECOM
2006
IEEE
14 years 3 months ago
Linear Coherent Decentralized Estimation
Abstract—We consider the distributed estimation of an unknown vector signal in a resource constrained sensor network with a fusion center. Due to power and bandwidth limitations,...
Jinjun Xiao, Shuguang Cui, Zhi-Quan Luo, Andrea J....
IEEEPACT
2006
IEEE
14 years 3 months ago
An empirical evaluation of chains of recurrences for array dependence testing
Code restructuring compilers rely heavily on program analysis techniques to automatically detect data dependences between program statements. Dependences between statement instanc...
Johnnie Birch, Robert A. van Engelen, Kyle A. Gall...
INFOCOM
2006
IEEE
14 years 3 months ago
Distributed Uplink Power Control for Optimal SIR Assignment in Cellular Data Networks
Abstract—This paper solves the joint power control and SIR assignment problem through distributed algorithms in the uplink of multi-cellular wireless networks. The 1993 Foschini-...
Prashanth Hande, Sundeep Rangan, Mung Chiang
ISPASS
2006
IEEE
14 years 3 months ago
Critical path analysis of the TRIPS architecture
Fast, accurate, and effective performance analysis is essential for the design of modern processor architectures and improving application performance. Recent trends toward highly...
Ramadass Nagarajan, Xia Chen, Robert G. McDonald, ...