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DAC
2009
ACM
14 years 8 months ago
Statistical reliability analysis under process variation and aging effects
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
DAC
2003
ACM
14 years 8 months ago
A cost-driven lithographic correction methodology based on off-the-shelf sizing tools
As minimum feature sizes continue to shrink, patterned features have become significantly smaller than the wavelength of light used in optical lithography. As a result, the requir...
Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, J...
ICSE
2008
IEEE-ACM
14 years 7 months ago
Testing pervasive software in the presence of context inconsistency resolution services
Pervasive computing software adapts its behavior according to the changing contexts. Nevertheless, contexts are often noisy. Context inconsistency resolution provides a cleaner pe...
Heng Lu, W. K. Chan, T. H. Tse
CHI
2009
ACM
14 years 7 months ago
Natural throw and tilt interaction between mobile phones and distant displays
Raimund Dachselt University of Magdeburg Faculty of Computer Science User Interface & Software Engineering Group 39106 Magdeburg, Germany dachselt@acm.org Robert Buchholz Unive...
Raimund Dachselt, Robert Buchholz
ICCCN
2007
IEEE
14 years 1 months ago
A Proactive Test Based Differentiation Technique to Mitigate Low Rate DoS Attacks
— Low rate DoS attacks are emerging threats to the TCP traffic, and the VoIP traffic in the Internet. They are hard to detect as they intelligently send attack traffic inside the...
Amey Shevtekar, Nirwan Ansari