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ISCAS
2007
IEEE
173views Hardware» more  ISCAS 2007»
14 years 1 months ago
Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM
— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
Riaz Naseer, Younes Boulghassoul, Jeff Draper, San...
ICDM
2002
IEEE
159views Data Mining» more  ICDM 2002»
14 years 11 days ago
O-Cluster: Scalable Clustering of Large High Dimensional Data Sets
Clustering large data sets of high dimensionality has always been a serious challenge for clustering algorithms. Many recently developed clustering algorithms have attempted to ad...
Boriana L. Milenova, Marcos M. Campos
HPCA
2000
IEEE
13 years 11 months ago
Modified LRU Policies for Improving Second-Level Cache Behavior
Main memory accesses continue to be a significant bottleneck for applications whose working sets do not fit in second-level caches. With the trend of greater associativity in seco...
Wayne A. Wong, Jean-Loup Baer
JIIS
2006
147views more  JIIS 2006»
13 years 7 months ago
Mining sequential patterns from data streams: a centroid approach
In recent years, emerging applications introduced new constraints for data mining methods. These constraints are typical of a new kind of data: the data streams. In data stream pro...
Alice Marascu, Florent Masseglia
ICML
2003
IEEE
14 years 8 months ago
Learning on the Test Data: Leveraging Unseen Features
This paper addresses the problem of classification in situations where the data distribution is not homogeneous: Data instances might come from different locations or times, and t...
Benjamin Taskar, Ming Fai Wong, Daphne Koller