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VTS
1997
IEEE
133views Hardware» more  VTS 1997»
14 years 24 days ago
ATPG for scan chain latches and flip-flops
A new approach for testing the bistable elements (latches and flip-flops) in scan chain circuits is presented. In this approach, we generate test patterns that apply a checking ex...
Samy Makar, Edward J. McCluskey
PR
2007
114views more  PR 2007»
13 years 8 months ago
Distributed Markovian segmentation: Application to MR brain scans
A situated approach to Markovian image segmentation is proposed based on a distributed, decentralized and cooperative strategy for model estimation. According to this approach, th...
Nathalie Richard, Michel Dojat, Catherine Garbay
EMNLP
2007
13 years 10 months ago
Probabilistic Coordination Disambiguation in a Fully-Lexicalized Japanese Parser
This paper describes a probabilistic model for coordination disambiguation integrated into syntactic and case structure analysis. Our model probabilistically assesses the parallel...
Daisuke Kawahara, Sadao Kurohashi