34 search results - page 5 / 7 » Cost Reduction and Evaluation of a Temporary Faults Detectin... |
IPPS
2005
IEEE
14 years 1 months ago
2005
IEEE
— Fault tolerance in MPI becomes a main issue in the HPC community. Several approaches are envisioned from user or programmer controlled fault tolerance to fully automatic fault ...
DAC
1997
ACM
13 years 12 months ago
1997
ACM
We examine frequency-domain issues in the design and selection of on-chip test generators for built-in self-test (BIST) of highperformance digital filters. Test-generator/circuit...
GI
2003
Springer
14 years 28 days ago
2003
Springer
: Virtual duplex systems have emerged as an alternative to traditional duplex systems, trading structural for temporal redundancy. When used in dependable embedded systems, virtual...
ICST
2009
IEEE
13 years 5 months ago
2009
IEEE
Measurement and detection of redundancy in test suites attempt to achieve test minimization which in turn can help reduce test maintenance costs, and to also ensure the integrity ...
VLSID
1993
IEEE
13 years 11 months ago
1993
IEEE
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...