1401 search results - page 21 / 281 » Cost-Sensitive Test Strategies |
ISCAS
2005
IEEE
14 years 1 months ago
2005
IEEE
— This paper presents a scheme for testing DACs’ static non-linearity errors by using a two-step flash ADC with deterministic dynamic element matching (DDEM). In this work, the...
ITS
2004
Springer
14 years 1 months ago
2004
Springer
Abstract. We describe Wayang Outpost, a web-based ITS for the Math section of the Scholastic Aptitude Test (SAT). It has several distinctive features: help with multimedia animatio...
COMPSAC
2003
IEEE
14 years 1 months ago
2003
IEEE
Short product cycles and rapidly changing requirements are increasingly forcing developers to use agile development strategies like extreme programming and test–driven developme...
GI
2007
Springer
14 years 1 months ago
2007
Springer
: A strategy for automatic test case selection based on the use of a similarity function is presented. Test case selection is a crucial activity to model-based testing since the nu...
ICCAD
1994
IEEE
13 years 11 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...