1401 search results - page 61 / 281 » Cost-Sensitive Test Strategies |
121
Voted
DAC
2000
ACM
16 years 4 months ago
2000
ACM
A major challenge in realizing core-based system chips is the adoption and design-in of adequate test and diagnosis strategies. This tutorial paper discusses the specific challeng...
120
Voted
AIME
2007
Springer
15 years 9 months ago
2007
Springer
Abstract. Most test-selection algorithms currently in use with probabilistic networks select variables myopically, that is, test variables are selected sequentially, on a one-by-on...
151
Voted
AGILEDC
2004
IEEE
15 years 7 months ago
2004
IEEE
Strong unit testing is the foundation of agile software development but embedded systems present special problems. Test of embedded software is bound up with test of hardware, cro...
121
Voted
VTS
1995
IEEE
15 years 7 months ago
1995
IEEE
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
137
Voted
ACIVS
2005
Springer
15 years 9 months ago
2005
Springer
Abstract. Functional magnetic resonance (fMRI) data are often corrupted with colored noise. To account for this type of noise, many prewhitening and pre-coloring strategies have be...