1401 search results - page 61 / 281 » Cost-Sensitive Test Strategies |
DAC
2000
ACM
14 years 10 months ago
2000
ACM
A major challenge in realizing core-based system chips is the adoption and design-in of adequate test and diagnosis strategies. This tutorial paper discusses the specific challeng...
AIME
2007
Springer
14 years 3 months ago
2007
Springer
Abstract. Most test-selection algorithms currently in use with probabilistic networks select variables myopically, that is, test variables are selected sequentially, on a one-by-on...
AGILEDC
2004
IEEE
14 years 23 days ago
2004
IEEE
Strong unit testing is the foundation of agile software development but embedded systems present special problems. Test of embedded software is bound up with test of hardware, cro...
VTS
1995
IEEE
14 years 17 days ago
1995
IEEE
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
ACIVS
2005
Springer
14 years 2 months ago
2005
Springer
Abstract. Functional magnetic resonance (fMRI) data are often corrupted with colored noise. To account for this type of noise, many prewhitening and pre-coloring strategies have be...