27 search results - page 6 / 6 » Cost-free scan: a low-overhead scan path design |
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
SIGMOD
2009
ACM
14 years 10 months ago
2009
ACM
The query models of the recent generation of very large scale distributed (VLSD) shared-nothing data storage systems, including our own PNUTS and others (e.g. BigTable, Dynamo, Ca...