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VLSID
2000
IEEE
102views VLSI» more  VLSID 2000»
14 years 2 days ago
Inductance Characterization of Small Interconnects Using Test-Signal Method
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
Jeegar Tilak Shah, Madhav P. Desai, Sugata Sanyal
ATS
2001
IEEE
172views Hardware» more  ATS 2001»
13 years 11 months ago
A Built-in Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters
Testing and diagnosis are important issues in system-onchip (SOC) development, as more and more embedded cores are being integrated into the chips. In this paper we propose a buil...
Chih-Wea Wang, Ruey-Shing Tzeng, Chi-Feng Wu, Chih...
ICWS
2010
IEEE
13 years 9 months ago
WebMov: A Dedicated Framework for the Modelling and Testing of Web Services Composition
This paper presents a methodology and a set of tools for the modelling, validation and testing of Web service composition, conceived and developed within the French national projec...
Ana R. Cavalli, Tien-Dung Cao, Wissam Mallouli, El...
INFSOF
2008
121views more  INFSOF 2008»
13 years 7 months ago
A test driven approach for aspectualizing legacy software using mock systems
Aspect-based refactoring, called aspectualization, involves moving program code that implements cross-cutting concerns into aspects. Such refactoring can improve the maintainabili...
Michael Mortensen, Sudipto Ghosh, James M. Bieman
ICSM
1999
IEEE
13 years 12 months ago
Criteria for Testing Exception-Handling Constructs in Java Programs
Exception-handling constructs provide a mechanism for raising exceptions, and a facility for designating protected code by attaching exception handlers to blocks of code. Despite ...
Saurabh Sinha, Mary Jean Harrold