1944 search results - page 95 / 389 » Coupling-based Integration Testing |
TCAD
2011
13 years 5 months ago
2011
—Pre-bond testing of 3-D stacked integrated circuits (ICs) involves testing each individual die before bonding. The overall yield of 3-D ICs improves with pre-bond testability be...
CAV
2011
Springer
13 years 1 months ago
2011
Springer
Abstract. Many automatic testing, analysis, and verification techniques for programs can effectively be reduced to a constraint-generation phase followed by a constraint-solving ...
ISQED
2006
IEEE
14 years 4 months ago
2006
IEEE
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
NPAR
2006
ACM
14 years 4 months ago
2006
ACM
We present techniques to create convincing high-quality watercolor illustrations of plants. Mainly focusing on the real-time rendering, we introduce methods to abstract the visual...
QSIC
2005
IEEE
14 years 3 months ago
2005
IEEE
Database application programs typically contain program units that use SQL statements to manipulate records in database instances. Testing the correctness of data manipulation by ...