529 search results - page 58 / 106 » Covariant Genetic Dynamics |
CEC
2005
IEEE
14 years 1 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
EVOW
2006
Springer
13 years 11 months ago
2006
Springer
The shaky ladder hyperplane-defined functions (sl-hdf's) are a test suite utilized for exploring the behavior of the genetic algorithm (GA) in dynamic environments. We present...
DATE
1997
IEEE
13 years 11 months ago
1997
IEEE
A new method for state justi cation is proposed for sequential circuit test generation. The linear list of states dynamically obtained during the derivation of test vectors is use...
AMC
2005
13 years 7 months ago
2005
In this paper, solving a cell formation (CF) problem in dynamic condition is going to be discussed by using some traditional metaheuristic methods such as genetic algorithm (GA), ...
HICSS
2006
IEEE
14 years 1 months ago
2006
IEEE
This study develops a novel model, GA-SVR, for parameters optimization in support vector regression and implements this new model in a problem forecasting maximum electrical daily...