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ITC
1997
IEEE
119views Hardware» more  ITC 1997»
14 years 1 months ago
Testability Analysis and ATPG on Behavioral RT-Level VHDL
This paper proposes an environment to address Testability Analysis and Test Pattern Generation on VHDL descriptions at the RT-level. The proposed approach, based on a suitable fau...
Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda
FMICS
2008
Springer
13 years 11 months ago
Extending Structural Test Coverage Criteria for Lustre Programs with Multi-clock Operators
Lustre is a formal synchronous declarative language widely used for modeling and specifying safety-critical applications in the elds of avionics, transportation or energy productio...
Virginia Papailiopoulou, Laya Madani, Lydie du Bou...
IJCAI
2003
13 years 11 months ago
Exploring Unknown Environments with Mobile Robots using Coverage Maps
In this paper we introduce coverage maps as a new way of representing the environment of a mobile robot. Coverage maps store for each cell of a given grid a posterior about the am...
Cyrill Stachniss, Wolfram Burgard
ACL
2004
13 years 11 months ago
Long-Distance Dependency Resolution in Automatically Acquired Wide-Coverage PCFG-Based LFG Approximations
This paper shows how finite approximations of long distance dependency (LDD) resolution can be obtained automatically for wide-coverage, robust, probabilistic Lexical-Functional G...
Aoife Cahill, Michael Burke, Ruth O'Donovan, Josef...
AMOST
2007
ACM
14 years 1 months ago
Achieving both model and code coverage with automated gray-box testing
We have devised a novel technique to automatically generate test cases for a software system, combining black-box model-based testing with white-box parameterized unit testing. Th...
Nicolas Kicillof, Wolfgang Grieskamp, Nikolai Till...