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GECCO
2009
Springer
162views Optimization» more  GECCO 2009»
14 years 2 days ago
TestFul: using a hybrid evolutionary algorithm for testing stateful systems
This paper introduces TestFul, a framework for testing stateful systems and focuses on object-oriented software. TestFul employs a hybrid multi-objective evolutionary algorithm, t...
Matteo Miraz, Pier Luca Lanzi, Luciano Baresi
EVOW
2008
Springer
13 years 9 months ago
An Evolutionary Methodology for Test Generation for Peripheral Cores Via Dynamic FSM Extraction
Traditional test generation methodologies for peripheral cores are performed by a skilled test engineer, leading to long generation times. In this paper a test generation methodolo...
Danilo Ravotto, Ernesto Sánchez, Massimilia...
ICCAD
2007
IEEE
110views Hardware» more  ICCAD 2007»
14 years 4 months ago
A hybrid scheme for compacting test responses with unknown values
This paper presents a hybrid compaction scheme for test responses containing unknown values, which consists of a space compactor and an unknown-blocking Multiple Input Signature R...
Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon W...
DATE
2007
IEEE
155views Hardware» more  DATE 2007»
14 years 1 months ago
Design fault directed test generation for microprocessor validation
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
Deepak Mathaikutty, Sandeep K. Shukla, Sreekumar V...
VLSI
2005
Springer
14 years 28 days ago
Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...
Erik Larsson, Stina Edbom