444 search results - page 20 / 89 » Creating Value Through Test |
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...
GLVLSI
2002
IEEE
14 years 22 days ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
ITC
1995
IEEE
13 years 11 months ago
1995
IEEE
A nalog circuit implementations of fuzzy logic are characterized by performing logical connectives of analog signals. They can be considered as generalization of digital circuits ...
TSE
2011
13 years 2 months ago
2011
—Event-Driven Software (EDS) can change state based on incoming events; common examples are GUI and web applications. These EDS pose a challenge to testing because there are a la...
NAACL
1994
13 years 9 months ago
1994
This paper presents and evaluates models created according to a schema that provides a description of the joint distribution of the values of sense tags and contextual features th...