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DAC
2003
ACM
14 years 8 months ago
A cost-driven lithographic correction methodology based on off-the-shelf sizing tools
As minimum feature sizes continue to shrink, patterned features have become significantly smaller than the wavelength of light used in optical lithography. As a result, the requir...
Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, J...
KDD
2004
ACM
154views Data Mining» more  KDD 2004»
14 years 8 months ago
Diagnosing extrapolation: tree-based density estimation
There has historically been very little concern with extrapolation in Machine Learning, yet extrapolation can be critical to diagnose. Predictor functions are almost always learne...
Giles Hooker
CODES
2008
IEEE
14 years 2 months ago
Scratchpad allocation for concurrent embedded software
Software-controlled scratchpad memory is increasingly employed in embedded systems as it offers better timing predictability compared to caches. Previous scratchpad allocation alg...
Vivy Suhendra, Abhik Roychoudhury, Tulika Mitra
WSNA
2003
ACM
14 years 27 days ago
Cleaning and querying noisy sensors
Sensor networks have become an important source of data with numerous applications in monitoring various real-life phenomena as well as industrial applications and traffic contro...
Eiman Elnahrawy, Badri Nath
SIGMOD
2011
ACM
241views Database» more  SIGMOD 2011»
12 years 10 months ago
Neighborhood based fast graph search in large networks
Complex social and information network search becomes important with a variety of applications. In the core of these applications, lies a common and critical problem: Given a labe...
Arijit Khan, Nan Li, Xifeng Yan, Ziyu Guan, Supriy...