1518 search results - page 32 / 304 » Cryptographic Test Correction |
AICCSA
2001
IEEE
14 years 2 months ago
2001
IEEE
In corrective maintenance, selective regression testing includes test selection from previously run test suite and test coverage identification. We propose three reductionbased re...
KBSE
2003
IEEE
14 years 4 months ago
2003
IEEE
Test designers widely believe that the overall effectiveness and cost of software testing depends largely on the type and number of test cases executed on the software. In this pa...
DSD
2010
IEEE
13 years 11 months ago
2010
IEEE
—Periodic on-chip scan-based tests have to be applied to a many-core processor SoC to improve its dependability. An infrastructural IP module has been designed and incorporated i...
ICST
2009
IEEE
14 years 5 months ago
2009
IEEE
It is challenging to test applications and functions for which the correct output for arbitrary input cannot be known in advance, e.g. some computational science or machine learni...
KDD
2000
ACM
14 years 2 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...