1327 search results - page 57 / 266 » Data Dependent Circuit Design: A Case Study |
ISVLSI
2007
IEEE
14 years 2 months ago
2007
IEEE
As technology scales, more sophisticated fabrication processes cause variations in many different parameters in the device. These variations could severely affect the performance ...
DAC
2006
ACM
14 years 2 months ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
GECCO
2008
Springer
13 years 9 months ago
2008
Springer
In Multi-Objective Problems (MOPs) involving uncertainty, each solution might be associated with a cluster of performances in the objective space depending on the possible scenari...
ICDM
2009
IEEE
13 years 5 months ago
2009
IEEE
In this paper we study the problem of classifier learning where the input data contains unjustified dependencies between some data attributes and the class label. Such cases arise...
WEA
2009
Springer
14 years 2 months ago
2009
Springer
A dynamic shortest-path algorithm is called a batch algorithm if it is able to handle graph changes that consist of multiple edge updates at a time. In this paper we focus on fully...