1581 search results - page 145 / 317 » Date Warehouse Design |
147
Voted
DATE
2009
IEEE
15 years 10 months ago
2009
IEEE
Since pre-silicon functional verification is insufficient to detect all design errors, re-spins are often needed due to malfunctions that escape into the silicon. This paper pre...
111
click to vote
DATE
2009
IEEE
15 years 10 months ago
2009
IEEE
—The IEEE 802.15.4a amendment has introduced ultra-wideband impulse radio (UWB IR) as a promising physical layer for energy-efficient, low data rate communications. A critical p...
144
click to vote
DATE
2009
IEEE
15 years 10 months ago
2009
IEEE
Abstract— This paper presents a six-transistor (6T) singleended static random access memory (SE-SRAM) bitcell with an isolated read-port, suitable for low-Î and low-power embedd...
112
click to vote
DATE
2009
IEEE
15 years 10 months ago
2009
IEEE
—Today verification, testing and debugging of SystemC models can be applied at an early stage in the design process. To support these techniques gaining required information of ...
114
Voted
DATE
2009
IEEE
15 years 10 months ago
2009
IEEE
Equivalence checking and property checking are powerful techniques to detect error traces. Debugging these traces is a time consuming design task where automation provides help. I...