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2005
IEEE
127views Hardware» more  DATE 2005»
15 years 10 months ago
A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test Application
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Rayc...
DATE
2005
IEEE
121views Hardware» more  DATE 2005»
15 years 10 months ago
C Compiler Retargeting Based on Instruction Semantics Models
Efficient architecture exploration and design of application specific instruction-set processors (ASIPs) requires retargetable software development tools, in particular C compil...
Jianjiang Ceng, Manuel Hohenauer, Rainer Leupers, ...
DATE
2005
IEEE
128views Hardware» more  DATE 2005»
15 years 10 months ago
Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits
Nanometer circuits are becoming increasingly susceptible to soft-errors due to alpha-particle and atmospheric neutron strikes as device scaling reduces node capacitances and suppl...
Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhij...
DATE
2005
IEEE
163views Hardware» more  DATE 2005»
15 years 10 months ago
A Hardware-Friendly Wavelet Entropy Codec for Scalable Video
In the RESUME project we explore the use of reconfigurable hardware for the design of portable multimedia systems by developing a scalable wavelet-based video codec. A scalable v...
Hendrik Eeckhaut, Harald Devos, Benjamin Schrauwen...
DATE
2005
IEEE
116views Hardware» more  DATE 2005»
15 years 10 months ago
A Complete Network-On-Chip Emulation Framework
Current Systems-On-Chip (SoC) execute applications that demand extensive parallel processing. Networks-OnChip (NoC) provide a structured way of realizing interconnections on silic...
Nicolas Genko, David Atienza, Giovanni De Micheli,...