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139
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DATE
2010
IEEE
15 years 11 months ago
2010
IEEE
—With the advancement of CMOS manufacturing process to nano-scale, future shipped microprocessors will be increasingly vulnerable to intermittent faults. Quantitatively character...
173
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DATE
2010
IEEE
15 years 11 months ago
2010
IEEE
— Ubiquitous image processing tasks (such as transform decompositions, filtering and motion estimation) do not currently provide graceful degradation when their clock-cycles budg...
148
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DATE
2010
IEEE
15 years 11 months ago
2010
IEEE
—Temperature has a strong influence on integrated circuit (IC) performance, power consumption, and reliability. However, accurate thermal analysis can impose high computation co...
137
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DATE
2010
IEEE
15 years 11 months ago
2010
IEEE
—Recent developments have shown the possibility of leveraging silicon nanophotonic technologies for chip-scale interconnection fabrics that deliver high bandwidth and power effi...
123
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DATE
2010
IEEE
15 years 11 months ago
2010
IEEE
Abstract—Future microprocessors increasingly rely on an unreliable CMOS fabric due to aggressive scaling of voltage and frequency, and shrinking design margins. Fortunately, many...