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» Defect Characterization for Scaling of QCA Devices
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DFT
2004
IEEE
118views VLSI» more  DFT 2004»
14 years 9 days ago
Defect Characterization for Scaling of QCA Devices
Quantum dot Cellular Automata (QCA) is amongst promising new computing scheme in the nano-scale regimes. As an emerging technology, QCA relies on radically different operations in...
Jing Huang, Mariam Momenzadeh, Mehdi Baradaran Tah...
DATE
2006
IEEE
136views Hardware» more  DATE 2006»
14 years 2 months ago
Defect tolerance of QCA tiles
Quantum dot Cellular Automata (QCA) is one of the promising technologies for nano scale implementation. The operation of QCA systems is based on a new paradigm generally referred ...
Jing Huang, Mariam Momenzadeh, Fabrizio Lombardi