Tolerating defects and fabrication variations will be critical in any system made with devices that have nanometer feature sizes. This paper considers how fabrication variations a...
Michael T. Niemier, Michael Crocker, Xiaobo Sharon...
We propose a built-in self-test (BIST) procedure for nanofabrics implemented using chemically assembled electronic nanotechnology. Several fault detection configurations are prese...
Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near horizon. However, the trem...
Margarida F. Jacome, Chen He, Gustavo de Veciana, ...
Since the non-cache parts of a core are less regular, compared to on-chip caches, tolerating manufacturing defects in the processing core is a more challenging problem. Due to the ...
Amin Ansari, Shuguang Feng, Shantanu Gupta, Scott ...
Defect tolerance is a major issue in nano computing. In this paper, an application-independent defect tolerant scheme for reconfigurable crossbar nano-architectures is presented....