1509 search results - page 260 / 302 » Depth from Scattering |
CORR
2008
Springer
13 years 11 months ago
2008
Springer
Emerging 3D chips stacking and MEMS/Sensors packaging technologies are using DRIE (Deep Reactive Ion Etching) to etch Through-Silicon Via (TSV) for advanced interconnections. The ...
CORR
2008
Springer
13 years 11 months ago
2008
Springer
In this article we review standard null-move pruning and introduce our extended version of it, which we call verified null-move pruning. In verified null-move pruning, whenever th...
EOR
2010
13 years 11 months ago
2010
For a finite set of points S, the (monochromatic) Reverse Nearest Neighbor (RNN) rule associates with any query point q the subset of points in S that have q as its nearest neighb...
EC
2008
13 years 11 months ago
2008
The development of successful metaheuristic algorithms such as local search for a difficult problems such as satisfiability testing (SAT) is a challenging task. We investigate an ...
ESWA
2008
13 years 11 months ago
2008
Resources in virtual organizations are classified based on their local taxonomies. However, heterogeneity between these taxonomies is a serious problem for efficient cooperation p...