124 search results - page 20 / 25 » Design Guidelines for Metallic-Carbon-Nanotube-Tolerant Digi... |
ICES
2000
Springer
13 years 11 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
VLSID
2009
IEEE
14 years 8 months ago
2009
IEEE
: The challenges in nano-CMOS circuit design include the following: variability, leakage, power, thermals, reliability, and yield. This talk will focus on interdependent considerat...
FLAIRS
2004
13 years 9 months ago
2004
The Federal Highway Administration (FHWA) Office of Highway Planning requires states to furnish vehicle classification data as part of the Highway Performance Monitoring Systems (...
MTDT
2003
IEEE
14 years 25 days ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
DAC
2009
ACM
14 years 8 months ago
2009
ACM
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...