380 search results - page 20 / 76 » Design Methods for Multiple-Valued Input Address Generators |
GECCO
2005
Springer
14 years 1 months ago
2005
Springer
Several general purpose benchmark generators are now available in the literature. They are convenient tools in dynamic continuous optimization as they can produce test instances w...
ISMIS
2005
Springer
14 years 1 months ago
2005
Springer
Abstract. Testing of database applications is of great importance. Although various studies have been conducted to investigate testing techniques for database design, relatively fe...
ICCD
2002
IEEE
14 years 4 months ago
2002
IEEE
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
JCDL
2004
ACM
14 years 1 months ago
2004
ACM
Automatic generation of semantic metadata describing spatial relations is highly desirable for image digital libraries. Relative spatial relations between objects in an image conv...
TCAD
2002
13 years 7 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...