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» Design Optimization for Robustness to Single Event Upsets
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TVLSI
2010
13 years 2 months ago
Pattern Sensitive Placement Perturbation for Manufacturability
The gap between VLSI technology and fabrication technology leads to strong refractive effects in lithography. Consequently, it is a huge challenge to reliably print layout features...
Shiyan Hu, Patrik Shah, Jiang Hu
WCRE
1995
IEEE
13 years 11 months ago
The Interleaving Problem in Program Understanding
One of the factors that can make a program di cult to understand is that code responsible for accomplishing more than one purpose may be woven together in a single section. We cal...
Spencer Rugaber, Kurt Stirewalt, Linda M. Wills
ATVA
2007
Springer
136views Hardware» more  ATVA 2007»
14 years 1 months ago
Symbolic Fault Tree Analysis for Reactive Systems
Fault tree analysis is a traditional and well-established technique for analyzing system design and robustness. Its purpose is to identify sets of basic events, called cut sets, wh...
Marco Bozzano, Alessandro Cimatti, Francesco Tappa...
COR
2008
116views more  COR 2008»
13 years 7 months ago
Supply disruptions with time-dependent parameters
We consider a firm that faces random demand and receives product from a single supplier who faces random supply. The supplier's availability may be affected by events such as...
Andrew M. Ross, Ying Rong, Lawrence V. Snyder
JAIR
2006
87views more  JAIR 2006»
13 years 7 months ago
Fault Tolerant Boolean Satisfiability
A -model is a satisfying assignment of a Boolean formula for which any small alteration, such as a single bit flip, can be repaired by flips to some small number of other bits, yi...
Amitabha Roy