343 search results - page 15 / 69 » Design Patterns for Complex Event Processing |
GECCO
2008
Springer
13 years 12 months ago
2008
Springer
The aim of process mining is to identify and extract process patterns from data logs to reconstruct an overall process flowchart. As business processes become more and more comple...
ICPPW
2008
IEEE
14 years 5 months ago
2008
IEEE
Event traces are helpful in understanding the performance behavior of message-passing applications since they allow in-depth analyses of communication and synchronization patterns...
EDO
2000
Springer
14 years 2 months ago
2000
Springer
Developing a distributed application is hard due to the complexity inherent to distributed communication. Moreover, distributed object communication technology is always changing,...
METRICS
2003
IEEE
14 years 4 months ago
2003
IEEE
This paper addresses not only the question of testability measurement of OO designs but also focuses on its practicability. While detecting testability weaknesses (called testabil...
VTS
2008
IEEE
14 years 5 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...