605 search results - page 22 / 121 » Design Principles for Combiners with Memory |
ESA
2006
Springer
14 years 9 days ago
2006
Springer
We address the problem of sorting in the presence of faults that may arbitrarily corrupt memory locations, and investigate the impact of memory faults both on the correctness and ...
AGILEDC
2008
IEEE
14 years 3 months ago
2008
IEEE
A core principle of Agile development is to satisfy the customer by providing valuable software on an early and continuous basis. For a software application to be valuable it shou...
CA
1999
IEEE
14 years 29 days ago
1999
IEEE
This paper presents a simple and efficient method of modeling synthetic vision, memory, and learning for autonomous animated characters in real-time virtual environments. The mode...
MTDT
2003
IEEE
14 years 1 months ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
DATE
2003
IEEE
14 years 1 months ago
2003
IEEE
In modern SoCs, embedded memories occupy the largest part of the chip area and include an even larger amount of active devices. As memories are designed very tightly to the limits...