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DAC
2008
ACM
14 years 8 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego
GLVLSI
2006
IEEE
115views VLSI» more  GLVLSI 2006»
14 years 1 months ago
Yield enhancement of asynchronous logic circuits through 3-dimensional integration technology
This paper presents a systematic design methodology for yield enhancement of asynchronous logic circuits using 3-D (3-Dimensional) integration technology. In this design, the targ...
Song Peng, Rajit Manohar
DAC
2005
ACM
14 years 8 months ago
Fault and energy-aware communication mapping with guaranteed latency for applications implemented on NoC
As feature sizes shrink, transient failures of on-chip network links become a critical problem. At the same time, many applications require guarantees on both message arrival prob...
Sorin Manolache, Petru Eles, Zebo Peng
VLSID
2005
IEEE
107views VLSI» more  VLSID 2005»
14 years 1 months ago
Design, Testing, and Applications of Digital Microfluidics-Based Biochips
Microfluidics-based biochips offer a promising platform for massively parallel DNA analysis, automated drug discovery, and real-time biomolecular recognition. The first part of th...
Krishnendu Chakrabarty
CCGRID
2001
IEEE
13 years 11 months ago
XtremWeb: A Generic Global Computing System
Global Computing achieves high throughput computing by harvesting a very large number of unused computing resources connected to the Internet. This parallel computing model target...
Gilles Fedak, Cécile Germain, Vincent N&eac...