49 search results - page 7 / 10 » Design fault directed test generation for microprocessor val... |
ICCAD
2003
IEEE
14 years 23 days ago
2003
IEEE
Domino circuits have been used in most modern high-performance microprocessor designs because of their high speed, low transistor-count and hazard-free operation. However, with te...
EMSOFT
2008
Springer
13 years 9 months ago
2008
Springer
The Simulink/Stateflow (SL/SF) environment from Mathworks is becoming the de facto standard in industry for model based development of embedded control systems. Many commercial to...
IFIP
2001
Springer
13 years 12 months ago
2001
Springer
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...
TSE
2010
13 years 2 months ago
2010
Genetic algorithms (GAs) have been applied previously to UML-driven, stress test requirements generation with the aim of increasing chances of discovering faults relating to networ...
ATVA
2007
Springer
14 years 1 months ago
2007
Springer
Fault tree analysis is a traditional and well-established technique for analyzing system design and robustness. Its purpose is to identify sets of basic events, called cut sets, wh...