88 search results - page 15 / 18 » Design for manufacturability in submicron domain |
ASAP
2004
IEEE
13 years 11 months ago
2004
IEEE
Decreasing feature sizes allow additional functionality to be added to future microprocessors to improve the performance of important application domains. As a result of rapid gro...
IJCAI
1989
13 years 8 months ago
1989
Solving design and analysis problems in physical worlds requires the representatio n of large amounts of knowledge. Recently, there has been much interest in explicitly making ass...
JGAA
2000
13 years 7 months ago
2000
This paper considers problems of the following type: given an edgeweighted k-colored input graph with maximum color class size c, find a minimum or maximum c-way cut such that eac...
TASE
2010
IEEE
13 years 2 months ago
2010
IEEE
Concurrent engineering (CE) is a methodology applied to product lifecycle development so that high quality, well designed products can be provided at lower prices and in less time....
AEI
2006
13 years 7 months ago
2006
This paper presents a linguistic framework for developing a formal knowledge acquisition method. The framework is intended to empower domain experts to specify information require...