Redundancy is the basic technique to provide reliability in storage systems consisting of multiple components. A redundancy scheme defines how the redundant data are produced and...
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
The virtual synchrony model for group communication has proven to be a powerful paradigm for building distributed applications. Implementations of virtual synchrony usually requir...
Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety c...
Jason A. Blome, Shantanu Gupta, Shuguang Feng, Sco...
It is known that temperature gradients and thermal hotspots affect the reliability of microprocessors. Temperature is also an important constraint when maximizing the performance...
Vinay Hanumaiah, Ravishankar Rao, Sarma B. K. Vrud...