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ESOP
2009
Springer
15 years 11 months ago
An Interval-Based Inference of Variant Parametric Types
Abstract. Variant parametric types (VPT) represent the successful result of combining subtype polymorphism with parametric polymorphism to support a more flexible subtyping for Ja...
Florin Craciun, Wei-Ngan Chin, Guanhua He, Shengch...
HIPEAC
2009
Springer
15 years 11 months ago
Adapting Application Mapping to Systematic Within-Die Process Variations on Chip Multiprocessors
Process variations, which lead to timing and power variations across identically-designed components, have been identified as one of the key future design challenges by the semico...
Yang Ding, Mahmut T. Kandemir, Mary Jane Irwin, Pa...
KDD
2009
ACM
189views Data Mining» more  KDD 2009»
15 years 11 months ago
CoCo: coding cost for parameter-free outlier detection
How can we automatically spot all outstanding observations in a data set? This question arises in a large variety of applications, e.g. in economy, biology and medicine. Existing ...
Christian Böhm, Katrin Haegler, Nikola S. M&u...
DATE
2009
IEEE
116views Hardware» more  DATE 2009»
15 years 10 months ago
An MDE methodology for the development of high-integrity real-time systems
—This paper reports on experience gained and lessons learned from an intensive investigation of model-driven engineering methodology and technology for application to high-integr...
Silvia Mazzini, Stefano Puri, Tullio Vardanega
DATE
2009
IEEE
137views Hardware» more  DATE 2009»
15 years 10 months ago
A self-adaptive system architecture to address transistor aging
—As semiconductor manufacturing enters advanced nanometer design paradigm, aging and device wear-out related degradation is becoming a major concern. Negative Bias Temperature In...
Omer Khan, Sandip Kundu
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