Abstract. Variant parametric types (VPT) represent the successful result of combining subtype polymorphism with parametric polymorphism to support a more flexible subtyping for Ja...
Process variations, which lead to timing and power variations across identically-designed components, have been identified as one of the key future design challenges by the semico...
Yang Ding, Mahmut T. Kandemir, Mary Jane Irwin, Pa...
How can we automatically spot all outstanding observations in a data set? This question arises in a large variety of applications, e.g. in economy, biology and medicine. Existing ...
—This paper reports on experience gained and lessons learned from an intensive investigation of model-driven engineering methodology and technology for application to high-integr...
—As semiconductor manufacturing enters advanced nanometer design paradigm, aging and device wear-out related degradation is becoming a major concern. Negative Bias Temperature In...