A statistical technique X-IDDQ for extracting defect information from IDDQ data is presented that is effective for detection of defects in ICs. The technique treats the IDDQ measu...
Ashutosh Sharma, Anura P. Jayasumana, Yashwant K. ...
We present a method for embedding and detection of visual watermark patterns in printed images that use clustered-dot halftones in the printing process. The method allows two inde...
Background: Functionally related genes tend to be correlated in their expression patterns across multiple conditions and/or tissue-types. Thus co-expression networks are often use...
Matthew Hansen, Logan Everett, Larry Singh, Sridha...
Continued scaling of CMOS technology to smaller transistor sizes makes modern processors more susceptible to both transient and permanent hardware faults. Circuitlevel techniques ...
Transient faults are emerging as a critical concern in the reliability of general-purpose microprocessors. As architectural trends point towards multi-threaded multi-core designs,...
Alex Shye, Tipp Moseley, Vijay Janapa Reddi, Josep...