— Test Pattern Generation for combinational circuits entails the identification of primary input assignments for detecting each fault in a set of target faults. An extension to ...
We address the problem of testing and debugging concurrent, distributed Erlang applications. In concurrent programs, race conditions are a common class of bugs and are very hard t...
Koen Claessen, Michal Palka, Nicholas Smallbone, J...
Recent studies have suggested that the soft-error rate in microprocessor logic will become a reliability concern by 2010. This paper proposes an efficient error detection techniqu...
Jared C. Smolens, Brian T. Gold, Jangwoo Kim, Baba...
We present a new tool, named DART, for automatically testing software that combines three main techniques: (1) automated extraction of the interface of a program with its external...
One of the key roles of any information system is to enforce the business rules and policies set by the owning organisation. As for any important functionality, it is necessary to...