Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...
Abstract. Code injection attacks that target the control-data of an application have been prevalent amongst exploit writers for over 20 years. Today however, these attacks are gett...
Steven Van Acker, Nick Nikiforakis, Pieter Philipp...
Abstract--Parallel programming is hard, because it is impractical to test all possible thread interleavings. One promising approach to improve a multi-threaded program's relia...
Smart phones can collect and share Bluetooth co-location traces to identify ad hoc or semi-permanent social groups. This information, known to group members but otherwise unavailab...
Steve Mardenfeld, Daniel Boston, Susan Juan Pan, Q...