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ITC
2003
IEEE
124views Hardware» more  ITC 2003»
14 years 1 months ago
Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ
Very Deep Sub-Micron (VDSM) defects are resolved as Statistical Post-Processing™ (SPP) outliers of a new IDDQ screen. The screen applies an IDDQ pattern once to the Device Under...
Chris Schuermyer, Brady Benware, Kevin Cota, Rober...
IPPS
2008
IEEE
14 years 2 months ago
Outlier detection in performance data of parallel applications
— When an adaptive software component is employed to select the best-performing implementation for a communication operation at runtime, the correctness of the decision taken str...
Katharina Benkert, Edgar Gabriel, Michael M. Resch
BMCBI
2005
120views more  BMCBI 2005»
13 years 7 months ago
Robust detection of periodic time series measured from biological systems
Background: Periodic phenomena are widespread in biology. The problem of finding periodicity in biological time series can be viewed as a multiple hypothesis testing of the spectr...
Miika Ahdesmäki, Harri Lähdesmäki, ...
CORR
2010
Springer
159views Education» more  CORR 2010»
13 years 7 months ago
Outlier Detection Using Nonconvex Penalized Regression
This paper studies the outlier detection problem from the point of view of penalized regressions. Our regression model adds one mean shift parameter for each of the n data points....
Yiyuan She, Art B. Owen
ICCV
2001
IEEE
14 years 9 months ago
Real-Time Feature Tracking and Outlier Rejection with Changes in Illumination
We develop an efficient algorithm to track point features supported by image patches undergoing affine deformations and changes in illumination. The algorithm is based on a combin...
Hailin Jin, Paolo Favaro, Stefano Soatto