434 search results - page 10 / 87 » Detection and correction of design defects in object-oriente... |
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
ITC
1989
IEEE
13 years 11 months ago
1989
IEEE
- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...
DMS
2008
13 years 9 months ago
2008
A root cause is a source of a defect such that if it is removed, the defect is subsequently decreased or removed. By analyzing the root causes of defects of our software projects,...
SCAM
2007
IEEE
14 years 1 months ago
2007
IEEE
SUDS is a powerful infrastructure for creating dynamic bug detection tools. It contains phases for both static analysis and dynamic instrumentation allowing users to create tools ...
KBSE
1997
IEEE
13 years 11 months ago
1997
IEEE
Modern software systems are designed and implemented in a modular fashion by composing individual components. Early validation of individual module designs and implementations off...