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ESEM
2008
ACM
13 years 9 months ago
Are good code reviewers also good at design review?
Software review is a necessity activity to build high reliability software in software development. In this paper, we experimentally analyze the difference in performance between ...
Hidetake Uwano, Akito Monden, Ken-ichi Matsumoto
ICCAD
2007
IEEE
137views Hardware» more  ICCAD 2007»
14 years 4 months ago
Combining static and dynamic defect-tolerance techniques for nanoscale memory systems
Abstract— Nanoscale technology promises dramatically increased device density, but also decreased reliability. With bit error rates projected to be as high as 10%, designing a us...
Susmit Biswas, Gang Wang, Tzvetan S. Metodi, Ryan ...
IOLTS
2008
IEEE
102views Hardware» more  IOLTS 2008»
14 years 1 months ago
Integrating Scan Design and Soft Error Correction in Low-Power Applications
— Error correcting coding is the dominant technique to achieve acceptable soft-error rates in memory arrays. In many modern circuits, the number of memory elements in the random ...
Michael E. Imhof, Hans-Joachim Wunderlich, Christi...
TSMC
2002
99views more  TSMC 2002»
13 years 7 months ago
Defect detection in textured materials using optimized filters
Theproblemofautomateddefectdetectionintextured materials is investigated. A new approach for defect detection using linearFIRfilterswithoptimizedenergyseparationisproposed.Performa...
Ajay Kumar, Grantham K. H. Pang
ISQED
2009
IEEE
126views Hardware» more  ISQED 2009»
14 years 2 months ago
Robust differential asynchronous nanoelectronic circuits
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
Bao Liu