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HPCA
2008
IEEE
14 years 8 months ago
Supporting highly-decoupled thread-level redundancy for parallel programs
The continued scaling of device dimensions and the operating voltage reduces the critical charge and thus natural noise tolerance level of transistors. As a result, circuits can p...
M. Wasiur Rashid, Michael C. Huang
SIGGRAPH
1992
ACM
13 years 11 months ago
Interactive inspection of solids: cross-sections and interferences
To reduce the cost of correcting design errors, assemblies of mechanical parts are modeled using CAD systems and verified electronically before the designs are sent to manufacturi...
Jarek Rossignac, Abe Megahed, Bengt-Olaf Schneider
CASES
2006
ACM
13 years 11 months ago
Cost-efficient soft error protection for embedded microprocessors
Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety c...
Jason A. Blome, Shantanu Gupta, Shuguang Feng, Sco...
WOTUG
2007
13 years 8 months ago
A Process Oriented Approach to USB Driver Development
Abstract. Operating-systems are the core software component of many modern computer systems, ranging from small specialised embedded systems through to large distributed operating-...
Carl G. Ritson, Fred R. M. Barnes
KDD
2007
ACM
202views Data Mining» more  KDD 2007»
14 years 8 months ago
Support feature machine for classification of abnormal brain activity
In this study, a novel multidimensional time series classification technique, namely support feature machine (SFM), is proposed. SFM is inspired by the optimization model of suppo...
Wanpracha Art Chaovalitwongse, Ya-Ju Fan, Rajesh C...