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MR
2010
120views Robotics» more  MR 2010»
13 years 6 months ago
Automated inspection and classification of flip-chip-contacts using scanning acoustic microscopy
Industrial applications often require failure analysis methods working non-destructively, enabling either a rapid quality control or fault isolation and defect localization prior ...
S. Brand, P. Czurratis, P. Hoffrogge, M. Petzold
IPPS
2007
IEEE
14 years 1 months ago
An Adaptive Semantic Filter for Blue Gene/L Failure Log Analysis
— Frequent failure occurrences are becoming a serious concern to the community of high-end computing, especially when the applications and the underlying systems rapidly grow in ...
Yinglung Liang, Yanyong Zhang, Hui Xiong, Ramendra...
ICSOC
2004
Springer
14 years 1 months ago
Assured service quality by improved fault management
The paradigm shift from device-oriented to service-oriented management has also implications to the area of event correlation. Today’s event correlation mainly addresses the cor...
Andreas Hanemann, Martin Sailer, David Schmitz
OOPSLA
2004
Springer
14 years 29 days ago
Resolving feature convolution in middleware systems
Middleware provides simplicity and uniformity for the development of distributed applications. However, the modularity of the architecture of middleware is starting to disintegrat...
Charles Zhang, Hans-Arno Jacobsen
ISCOPE
1999
Springer
13 years 12 months ago
Using Object-Oriented Techniques for Realizing Parallel Architectural Skeletons
The concept of design patterns has recently emerged as a new paradigm in the context of object-oriented design methodology. Similar ideas are being explored in other areas of compu...
Dhrubajyoti Goswami, Ajit Singh, Bruno R. Preiss