45 search results - page 4 / 9 » Diagonal Circuit Identity Testing and Lower Bounds |
ECCC
2011
13 years 2 months ago
2011
Polynomial identity testing (PIT) problem is known to be challenging even for constant depth arithmetic circuits. In this work, we study the complexity of two special but natural ...
CORR
2011
Springer
13 years 2 months ago
2011
Springer
In the paper, the global optimization problem of a multidimensional “black-box” function satisfying the Lipschitz condition over a hyperinterval with an unknown Lipschitz const...
STACS
2009
Springer
14 years 2 months ago
2009
Springer
Motivated by the quantum algorithm for testing commutativity of black-box groups (Magniez and Nayak, 2007), we study the following problem: Given a black-box finite ring by an add...
COCO
2009
Springer
14 years 2 months ago
2009
Springer
Devising an efficient deterministic – or even a nondeterministic sub-exponential time – algorithm for testing polynomial identities is a fundamental problem in algebraic comp...
TVLSI
1998
13 years 7 months ago
1998
— Excessive instantaneous power consumption may reduce the reliability and performance of VLSI chips. Hence, to synthesize circuits with high reliability, it is imperative to ef...