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ATS
2005
IEEE
144views Hardware» more  ATS 2005»
14 years 2 months ago
On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
Sandip Kundu, Piet Engelke, Ilia Polian, Bernd Bec...
ICSE
2009
IEEE-ACM
13 years 6 months ago
Configuration aware prioritization techniques in regression testing
Configurable software lets users customize applications in many ways, and is becoming increasingly prevalent. Regression testing is an important but expensive way to build confide...
Xiao Qu
CSSC
2008
75views more  CSSC 2008»
13 years 9 months ago
Statistical Certification of Software Systems
Common software release procedures based on statistical techniques try to optimise the trade-off between further testing costs and costs due to remaining errors. We propose new so...
Alessandro Di Bucchianico, Jan Friso Groote, Kees ...
APSEC
2005
IEEE
14 years 2 months ago
A Passive Test Oracle Using a Component's API
A test oracle is a mechanism that is used during testing to determine whether a software component behaves correctly or not. The test oracle problem is widely acknowledged in the ...
Rakesh Shukla, David A. Carrington, Paul A. Stroop...
VLSID
2000
IEEE
102views VLSI» more  VLSID 2000»
14 years 1 months ago
Inductance Characterization of Small Interconnects Using Test-Signal Method
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
Jeegar Tilak Shah, Madhav P. Desai, Sugata Sanyal