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ET
2002
122views more  ET 2002»
13 years 9 months ago
Using At-Speed BIST to Test LVDS Serializer/Deserializer Function
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...
Magnus Eckersand, Fredrik Franzon, Ken Filliter
AADEBUG
1995
Springer
14 years 22 days ago
Software Testability Measurement for Assertion Placement and Fault Localization
Software testability, the tendency for software to reveal its faults during testing, is an important issue for veri cation and quality assurance. Testability measurement can also b...
Jeffrey M. Voas
BMCBI
2011
13 years 4 months ago
Statistical Test of Expression Pattern (STEPath): a new strategy to integrate gene expression data with genomic information in i
Background: In the last decades, microarray technology has spread, leading to a dramatic increase of publicly available datasets. The first statistical tools developed were focuse...
Paolo G. V. Martini, Davide Risso, Gabriele Sales,...
ISSTA
2006
ACM
14 years 3 months ago
A regression tests selection technique for aspect-oriented programs
As the Aspect-Oriented Software Development gains popularity, there is growing interest as developing for existing object-oriented software aspects to address the crosscutting pro...
Guoqing Xu
ICC
2007
IEEE
100views Communications» more  ICC 2007»
14 years 3 months ago
S.T.R.E.S.S. : Stress Testing and Reverse Engineering for System Security
— In modern wireless networks the functions included into layer II have to deal with complex problems, such as security and access control, that were previously demanded to upper...
Matteo Rosi, Leonardo Maccari, Romano Fantacci