The discovery of complex patterns such as clusters, outliers, and associations from huge volumes of streaming data has been recognized as critical for many domains. However, patte...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...