Program checking, program self-correcting and program selftesting were pioneered by [Blum and Kannan] and [Blum, Luby and Rubinfeld] in the mid eighties as a new way to gain con...
Shafi Goldwasser, Dan Gutfreund, Alexander Healy, ...
Stochastic device noise has become a significant challenge for high-precision analog/RF circuits, and it is particularly difficult to correctly include both white noise and flic...
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...
Scaling is currently the most popular technique used to improve performance metrics of CMOS circuits. This cannot go on forever because the properties that are responsible for the ...
The paper presents a technique for the design of digital systems on the basis of reusable hardware templates, which are circuits with modifiable functionality that might be custom...