787 search results - page 55 / 158 » Digital Algebra and Circuits |
ECCC
2007
13 years 9 months ago
2007
Program checking, program self-correcting and program selftesting were pioneered by [Blum and Kannan] and [Blum, Luby and Rubinfeld] in the mid eighties as a new way to gain con...
DAC
2011
ACM
12 years 8 months ago
2011
ACM
Stochastic device noise has become a significant challenge for high-precision analog/RF circuits, and it is particularly difficult to correctly include both white noise and flic...
ITC
1994
IEEE
14 years 1 months ago
1994
IEEE
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...
ASPDAC
2008
ACM
13 years 11 months ago
2008
ACM
Scaling is currently the most popular technique used to improve performance metrics of CMOS circuits. This cannot go on forever because the properties that are responsible for the ...
IRI
2007
IEEE
14 years 3 months ago
2007
IEEE
The paper presents a technique for the design of digital systems on the basis of reusable hardware templates, which are circuits with modifiable functionality that might be custom...