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ETS
2011
IEEE
230views Hardware» more  ETS 2011»
12 years 10 months ago
Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis
—As circuits continue to scale to smaller feature sizes, wearout and latent defects are expected to cause an increasing number of errors in the field. Online error detection tec...
Nuno Alves, Y. Shi, N. Imbriglia, Jennifer Dworak,...
IJCAI
2003
14 years 7 days ago
Active Probing Strategies for Problem Diagnosis in Distributed Systems
We address the task of problem determination in a distributed system using probes, or test transactions, which gather information about system components. Effective probing requir...
Mark Brodie, Irina Rish, Sheng Ma, Natalia Odintso...