Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
This paper examines the effect of technology scaling and microarchitectural trends on the rate of soft errors in CMOS memory and logic circuits. We describe and validate an end-to...
Premkishore Shivakumar, Michael Kistler, Stephen W...
Facilitating the transfer of knowledge between knowledge workers represents one of the main challenges of knowledge management. Knowledge transfer instruments, such as the experie...
Markus Strohmaier, Eric S. K. Yu, Jennifer Horkoff...
The simulation of wireless networks has been an important tool for researchers and the industry in the last years. Especially in the field of Mobile Ad Hoc Networking, most curre...