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DAC
2006
ACM
15 years 10 months ago
Modeling and minimization of PMOS NBTI effect for robust nanometer design
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
Rakesh Vattikonda, Wenping Wang, Yu Cao
DSN
2002
IEEE
15 years 9 months ago
Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic
This paper examines the effect of technology scaling and microarchitectural trends on the rate of soft errors in CMOS memory and logic circuits. We describe and validate an end-to...
Premkishore Shivakumar, Michael Kistler, Stephen W...
HICSS
2007
IEEE
164views Biometrics» more  HICSS 2007»
15 years 10 months ago
Analyzing Knowledge Transfer Effectiveness--An Agent-Oriented Modeling Approach
Facilitating the transfer of knowledge between knowledge workers represents one of the main challenges of knowledge management. Knowledge transfer instruments, such as the experie...
Markus Strohmaier, Eric S. K. Yu, Jennifer Horkoff...
MSWIM
2006
ACM
15 years 10 months ago
The effect of the radio wave propagation model in mobile ad hoc networks
The simulation of wireless networks has been an important tool for researchers and the industry in the last years. Especially in the field of Mobile Ad Hoc Networking, most curre...
Arne Schmitz, Martin Wenig